Understanding Spatial Variability in Semiconductor Products with Spotfire Map Charts

Bosch Semiconductor uses Spotfire software to visualize and analyze semiconductor wafer map spatial test data. Spotfire multi-layered, trellised map charts allow engineers to examine wafer maps at any level of detail, grouping and binning wafers at will. Also, custom functions have been developed for creating smoothed 2-D contour plots to visualize spatial and parametric variations. These advanced visualizations and analytics are used by engineers to understand process and product variability to drive improved product quality and reliability across Bosch development and manufacturing groups. Come to be inspired to apply these techniques to your spatial and mapping use cases in all industries.